Olympus U-MDICT3 Cube Housing w/ Fixed Analyzer for Transmitted DIC U-TAD Electronics and semiconductor inspection —
Description
Electronics and semiconductor inspection — surface defect detection on wafers and components using an IX series inverted microscope
90 (with top lens) / 0
and fluorescence (FLUO) contrasting methods
OLYMPUS ACH N 20X POLARIZED LIGHT OBJECTIVE
Olympus U-MDICT3 Cube Housing w/ Fixed Analyzer for Transmitted DIC U-TAD Electronics and semiconductor inspection —Olympus U MDICT3 Cube Housing with Fixed Analyzer for Transmitted Light DIC Cube housing with integrated fixed analyzer for transmitted light differential interference contrast (DIC) microscopy on Olympus BX3 series microscopes provides a compact, integrated DIC analyzer solution. Fixed Analyzer Cube integrated analyzer in a cube housing for transmitted light DIC Compact Design self contained cube unit for easy installation in the BX3 cube turret
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