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Routine microscopy and inspection
LEITZ X Y ATTACHABLE POL STAGE ATTACHES TO THE LEITZ CIRCULAR STAGES TO PROVIDE X Y MOVEMENT OF YOUR SAMPLE
Forensic particle and fiber analysis
U-R156M5 — excellent condition
Olympus SLMPlan N 100X Epi Objective | 0.60 NA Super Long Working Distance, Infinity Corrected PLAN APOCHROMAT Routine microscopy and inspectionHigh magnification super long working distance optical objective for brightfield and inspection microscopy. 100 Magnification, NA 0. 60 Strong resolving power for detailed specimen analysis with ample space from the specimen. Super Long Working Distance (~7. 6 mm) Designed for imaging with thick samples or inspection tools without risk of contact. Plan Achromat Optical Design Minimizes chromatic and spherical aberrations for sharp, flat images. Ideal
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